Abstract
We report new performance measurements and computer simulations of a sub-millimeter pitch CdZnTe strip detector under study as a prototype imaging spectrometer for astronomical x-ray and gamma-ray observations. The prototype is 1.5 mm thick with 375 micron strip pitch in both the x and y dimensions. Previously reported work included demonstrations of half-pitch spatial resolution (approximately 190 microns) and good energy resolution and spectral uniformity. Strip detector efficiency measurements have also been presented. A model that includes the photon interaction, carrier transport and the electronics was developed that qualitatively reproduced the measurements. The new studies include measurements of the CdZnTe transport properties for this prototype in an effort to resolve quantitative discrepancies between the measurements and the simulations. Measurements of charge signals produced by laser pulses and (alpha) -rays are used to determine these transport properties. These are then used in the model to predict gamma-ray efficiencies that are compared with the data. The imaging performance of the detector is studied by scanned laser and gamma beam spot measurements. The results support the model's prediction of nearly linear sharing of the charge for interactions occurring in the region between electrodes. The potential for strip detectors with spatial resolution much finer than the strip pitch is demonstrated. A new design scheme for strip detectors is shortly discussed.
Department
Space Science Center, Physics
Publication Date
1-7-1997
Journal Title
SPIE Proceedings
Publisher
SPIE
Digital Object Identifier (DOI)
10.1117/12.277688
Document Type
Conference Proceeding
Recommended Citation
Olivier Tousignant ; Louis-Andre Hamel ; Jean-Francois Courville ; P. Paki ; John R. Macri ; Kipp Larson ; Michelle Mayer ; Mark L. McConnell and James M. Ryan "Progress in the study of CdZnTe strip detectors", Proc. SPIE 3115, Hard X-Ray and Gamma-Ray Detector Physics, Optics, and Applications, 214 (July 7, 1997); doi:10.1117/12.277688; http://dx.doi.org/10.1117/12.277688
Rights
© (1997) COPYRIGHT SPIE--The International Society for Optical Engineering.