Origins of nanoscale heterogeneity in ultrathin films
Abstract
A key challenge in thin-film growth is controlling structure and composition at the atomic scale. We have used spatially resolved electron scattering to measure how the three-dimensional composition profile of an alloy film evolves with time at the nanometer length scale. We show that heterogeneity during the growth of Pd on Cu(001) arises naturally from a generic step-overgrowth mechanism relevant in many growth systems.
Department
Physics
Publication Date
6-26-2006
Journal Title
Physical Review Letters
Publisher
AMERICAN PHYSICAL SOCIETY
Digital Object Identifier (DOI)
10.1103/PhysRevLett.96.246103
Document Type
Article
Recommended Citation
Hannon, J. B.; Sun, J.; Pohl, Karsten; and Kellogg, G. L., "Origins of nanoscale heterogeneity in ultrathin films" (2006). Physical Review Letters. 137.
https://scholars.unh.edu/physics_facpub/137
Rights
© 2006 The American Physical Society
