Determination of buried dislocation structures by scanning tunneling microscopy

Authors

J. de la Figuera
A. K. SchmidFollow
N. C. Bartelt
Karsten Pohl, University of New HampshireFollow
R. Q. Hwang

Abstract

Using scanning tunneling microscopy on Cu/Ru(0001) thin films we have located the depth at which the cores of misfit dislocations lie below the film surface. The procedure is based on matching areas with unknown structure to areas with a known stacking sequence in the same film. Our results show that dislocations occur not only at the Cu/Ru interface, but also at various levels within the Cu films. Our analysis method should be applicable to the characterization of dislocation structures in other ultrathin film systems.

Department

Physics

Publication Date

4-6-2001

Journal Title

Physical Review B

Publisher

AMERICAN PHYSICAL SOC

Digital Object Identifier (DOI)

10.1103/PhysRevB.63.165431

Document Type

Article

Recommended Citation

de la Figuera, J.; Schmid, A. K.; Bartelt, N. C.; Pohl, Karsten; and Hwang, R. Q., "Determination of buried dislocation structures by scanning tunneling microscopy" (2001). Physical Review B. 105.
https://scholars.unh.edu/physics_facpub/105

Rights

© 2001 The American Physical Society