Low and increased solubility of silicon in metal nitrides: evidence by X-ray absorption near edge structure

Authors

Jose L. Endrino, Instituto de Ciencia de Materiales de MadridFollow
Sergio Palacın, Universidad Autonoma de Madrid
Alejandro Gutierrez, Universidad Autonoma de Madrid
Franz Schaffers, BESSY GmbHFollow
James E. Krzanowski, University of New HampshireFollow

Department

Mechanical Engineering

Publication Date

6-16-2007

Journal Title

Journal of Materials Science

Publisher

SPRINGER

Digital Object Identifier (DOI)

10.1007/s10853-007-1870-9

Document Type

Article

Recommended Citation

Endrino, Jose L.; Palacın, Sergio; Gutierrez, Alejandro; Schaffers, Franz; and Krzanowski, James E., "Low and increased solubility of silicon in metal nitrides: evidence by X-ray absorption near edge structure " (2007). Journal of Materials Science. 17.
https://scholars.unh.edu/mecheng_facpub/17

Rights

© Springer Science+Business Media, LLC 2007