Direct Evidence for the Sequential Decay C60z+-->C58z+-->C56z+ -->
Abstract
Using a two sector field mass spectrometer in combination with a crossed beams ion source we have obtained direct experimental evidence that C60 fragment ions such as C58, C56, C54,… produced by electron impact ionization of C60 may be formed by unimolecular decay of the C60 parent ion involving sequential loss of C2. Moreover, by comparing experimental and theoretical breakdown graphs the overriding conclusion is that in the case of Cz+56 production (with z=1,2,3) sequential loss of two C2 units dominates over the loss of a single C4 unit.
Department
Physics
Publication Date
5-7-1996
Journal Title
Physical Review Letters
Publisher
APS Physics
Digital Object Identifier (DOI)
Document Type
Article
Recommended Citation
P. Scheier, B. Dünser, R. Wörgötter, D. Muigg, S. Matt, O. Echt, M. Foltin, and T. D. Märk, Direct Evidence for the Sequential Decay C60z+ ? C58z+ ? C56z+ ? … Phys. Rev. Lett. 77 (1996) 2654 – 2657, DOI: 10.1103/PhysRevLett.77.2654.